System on Chip Test Architectures

• Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
• Publisher : Morgan Kaufmann
• Release Date : 2010-07-28
• ISBN : 0080556809

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

• Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
• Publisher : Morgan Kaufmann
• Release Date : 2008
• ISBN : 9780123739735

Written by a stellar team of field experts, this title is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that allow VSLI designers, DFT practitioners, and students to master quickly System-on-Chip Test architectures, memory, and analog/mixed-signal designs.

• Author : Erik Larsson
• Publisher : Springer Science & Business Media
• Release Date : 2006-03-30
• ISBN : 9780387256245

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques

• Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
• Publisher : IGI Global
• Release Date : 2011-01-01
• ISBN : 9781609602147

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

• Author : Bashir M. Al-Hashimi
• Publisher : IET
• Release Date : 2006-01-31
• ISBN : 9780863415524

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

• Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
• Publisher : Springer
• Release Date : 2006-08-16
• ISBN : 9780387334035

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10

• Author : Krishnendu Chakrabarty
• Publisher : Springer Science & Business Media
• Release Date : 2013-04-17
• ISBN : 9781475765274

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

• Author : Dimitris Gizopoulos
• Publisher : Springer Science & Business Media
• Release Date : 2006-01-22
• ISBN : 9780387294094

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

• Author : Ricardo Reis,Vincent Mooney,Paul Hasler
• Publisher : Springer
• Release Date : 2009-04-05
• ISBN : 9780387895581

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working

• Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
• Publisher : Springer Science & Business Media
• Release Date : 2011-09-23
• ISBN : 1461407915

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

• Author : Youn-Long Steve Lin
• Publisher : Springer Science & Business Media
• Release Date : 2007-05-31
• ISBN : 9781402053528

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

• Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
• Publisher : Elsevier
• Release Date : 2006-08-14
• ISBN : 0080474799

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

• Author : W. Verhaegh,Wim Verhaegh,Emile Aarts,Jan Korst
• Publisher : Springer Science & Business Media
• Release Date : 2004
• ISBN : 140201757X

This book is the outcome of a series of discussions at the Philips Symposium on Intelligent Algorithms, which was held in Eindhoven on December 2002. It contains many exciting and practical examples from this newly developing research field, which can be positioned at the intersection of computer science, discrete mathematics, and artificial intelligence. The examples include machine learning, content management, vision, speech, content augmentation, profiling, music retrieval, feature extraction, audio and video fingerprinting, resource management, multimedia servers, network scheduling, and IC

• Author : Patrick Girard,Nicola Nicolici,Xiaoqing Wen
• Publisher : Springer Science & Business Media
• Release Date : 2010-03-11
• ISBN : 9781441909282

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores

• Author : Brandon Noia,Krishnendu Chakrabarty
• Publisher : Springer Science & Business Media
• Release Date : 2013-11-19
• ISBN : 9783319023786

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D